Work

Pseudo-functional testing for small delay defects considering power supply noise effects

Year: 2011

Type: conference-paper

DOI: 10.1109/iccad.2011.6105302

Authors: Feng Yuan, Xiao Liu, Qiang Xu

Institutions: Chinese University of Hong Kong, Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Fonds National de la Recherche Luxembourg

OpenAlex ID: W3147350862

FWCI: 1.678

Cites: 18

Cited by: 13

Related to: 10