Work

A study of integrated fault model of easily testable PLAs

Year: 2004

Type: article

Authors: Md. Rafiqul Islam, Morshed Chowdhury, Muhammad Reazul Haque

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W377225005

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