Work

IEEE Standard for Test Access Port and Boundary-Scan Architecture

Year: 2013

Type: standard

DOI: 10.1109/ieeestd.2013.6515989

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4231486519

Cites:

Cited by: 246

Related to: 10