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Guest Editorial: Defect and Fault Tolerance in VLSI and NanotechnologySystems

Year: 2019

Type: editorial

Source: IET Computers & Digital Techniques

DOI: 10.1049/iet-cdt.2019.0097

Authors: Miele A., Trefzer M. A., Khursheed S.

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W4238330867

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