Work

CAE systems include actual IC to avoid simulation obstacle

Year: 1984

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/0026-2714(84)90968-5

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4240006817

FWCI:

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Related to: 10