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An important step in quantitative auger analysis: The use of peak to background ratio

Year: 1984

Type: article

Source: Surface Science Letters

DOI: 10.1016/0167-2584(84)90394-3

Authors: J.P. Langeron, L. Minel, J.L. Vignes, S. Bouquet, F. Pellerin, G. Lorang, P. Ailloud, J. Le Héricy

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4240913615

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