Work

Dictionary-Based Sparse Representation for Resolution Improvement in Laser Voltage Imaging of CMOS Integrated Circuits

Year: 2015

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.7873/date.2015.0269

Authors: T. Berkin Cilingiroglu, Mahmoud Zangeneh, Aydan Uyar, W. Clem Karl, Janusz Konrad, Ajay Joshi, Bennett B. Goldberg, M. Selim Unlu

Institution: Boston University

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Intelligence Advanced Research Projects Activity, Air Force Research Laboratory

OpenAlex ID: W4243036236

FWCI: 0.416

Cites:

Cited by: 1

Related to: 10