Work

Modeling and Simulation of the SDC Data Collection Chip

Year: 2005

Type: conference-paper

Source: IEEE NPSS Real Time Conference on Computer Applications in Nuclear, Particle and Plasma Physics (RT)

DOI: 10.1109/rtcon.1991.673179

Authors: E. Hughes, G. Tharakan, R. Downing, M. Haney, E. Golin, L. Jones, D. Knapp, J. Thaler

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4246493866

FWCI: 0.563

Cites: 7

Cited by: 3

Related to: 10