Work

Transient errors resiliency analysis technique for automotive safety critical applications

Year: 2014

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.7873/date2014.022

Authors: Sujan Pandey, Bart Vermeulen

Institution: NXP (Netherlands)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4246719243

FWCI: 1.203

Cites:

Cited by: 5

Related to: 10