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A new BIST scheme with encoding logic to achieve complete fault coverage

Year: 2015

Type: conference-paper

Source: WIT transactions on engineering sciences

DOI: 10.2495/feem140451

Authors: Ling Zhang, Junjin Mei, Guan-zhong Wang, Tonghan Li

Institution: Hubei Polytechnic University

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4252000935

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