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High-Speed Interconnects: History, Evolution, and the Road Ahead
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Year:
2022
Type:
article
Source:
IEEE Microwave Magazine
DOI:
10.1109/mmm.2021.3136268
Authors:
Vijay Rao Kumbhare,
Rahul Kumar,
Manoj Kumar Majumder,
Somesh Kumar,
Punya Prasanna Paltani,
Brajesh Kumar Kaushik,
Rohit Sharma
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Institutions:
International Institute of Information Technology,
Indian Institute of Technology Ropar,
Atal Bihari Vajpayee Indian Institute of Information Technology and Management,
Indian Institute of Technology Roorkee
Language:
English
Topic:
Copper Interconnects and Reliability
Subfield:
Electronic, Optical and Magnetic Materials
Field:
Materials Science
Domain:
Physical Sciences
Open Access status:
closed
Funders:
Department of Science and Technology, Ministry of Science and Technology, India,
Ministry of Electronics and Information technology
OpenAlex ID:
W4284894344
FWCI:
1.955
Cites:
50
Cited by:
46
Related to:
10