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High-Speed Interconnects: History, Evolution, and the Road Ahead

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Year: 2022
Type: article
Source: IEEE Microwave Magazine
DOI: 10.1109/mmm.2021.3136268
Authors: Vijay Rao Kumbhare, Rahul Kumar, Manoj Kumar Majumder, Somesh Kumar, Punya Prasanna Paltani, Brajesh Kumar Kaushik, Rohit Sharma
Institutions: International Institute of Information Technology, Indian Institute of Technology Ropar, Atal Bihari Vajpayee Indian Institute of Information Technology and Management, Indian Institute of Technology Roorkee
Language: English

Topic: Copper Interconnects and Reliability
Subfield: Electronic, Optical and Magnetic Materials
Field: Materials Science
Domain: Physical Sciences

Open Access status: closed

Funders: Department of Science and Technology, Ministry of Science and Technology, India, Ministry of Electronics and Information technology
OpenAlex ID: W4284894344
FWCI: 1.955
Cites: 50
Cited by: 46
Related to: 10
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