Work

Yield in flash memory: Methodology, modeling and design issues.

Year: 2003

Type: conference-paper

Source: International Symposium on Quality Electronic Design (ISQED)

Author: G. Crisenza

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W43040031

FWCI:

Cites:

Cited by: 1

Related to: 10