Work

Correlation Analysis of Compacted Test Vectors and the Use of Correlated Vectors for Test Generation

Year: 2007

Type: article

Authors: Shuo Sheng, Ankur Jain, Michael S. Hsiao, Vishwani D. Agrawal

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W43311129

FWCI:

Cites: 2

Cited by: 6

Related to: 10