Work

A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications

Year: 2023

Type: article

Source: IEEE Transactions on Circuits and Systems I Regular Papers

DOI: 10.1109/tcsi.2023.3310876

Authors: Leonardo H. Brendler, Hervé Lapuyade, Yann Deval, Frédéric Darracq, Frédéric Fauquet, Ricardo Reis, François Rivet

Institutions: Universidade Federal do Rio Grande do Sul, Université de Bordeaux, Laboratoire de l'Intégration du Matériau au Système

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Conselho Nacional de Desenvolvimento Científico e Tecnológico

OpenAlex ID: W4386702976

FWCI: 0.147

Cites: 27

Cited by: 2

Related to: 10