Work

Nanoparticle Characterization with In Situ AFM-SEM-EDS

Year: 2024

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1093/mam/ozae044.233

Authors: Kerim T Arat, X Fan Dong, Lukas Stühn, William K Neils, Stefano Spagna

Institution: Quantum Design (United States)

Language: English

Topic: Electron and X-Ray Spectroscopy Techniques

Subfield: Surfaces, Coatings and Films

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4401005807

FWCI: 0.335

Cites: 10

Cited by: 3

Related to: 10