Work

High Throughput Multiple Device Diagnosis System for Hierarchical Test Designs

Year: 2024

Type: conference-paper

Source: Lecture notes in electrical engineering

DOI: 10.1007/978-981-97-5269-0_22

Authors: Atul Chhabra, Bharath Nandakumar, Sameer Chillarige, Dushyant Malhotra, Vatsal Grover

Institution: Cadence Design Systems (India)

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403552503

FWCI:

Cites: 10

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Related to: 10