Work

Automated Millimeter-Wave On-Wafer Testing System

Year: 1999

Type: article

Authors: Takayuki Katoh, Tatsuya Kashiwa, H. Hoshi, Akihiro Inoue, T. Ishikawa

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W52109461

FWCI: 1.176

Cites:

Cited by: 3

Related to: 10