Work

Fault detection test generation at the register transfer design level

Year: 1982

Type: article

Source: OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)

Authors: C.H. Chiang, F.J. Hill, Amir Mohseni, D.P. Chen

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W57784367

FWCI:

Cites:

Cited by: 1

Related to: 10