Work

Ieee P1687 – Ijtag

Year: 2010

Type: book-chapter

Source: Springer eBooks

DOI: 10.1007/978-1-4419-7563-8_9

Author: Neal Stollon

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7158885

FWCI: 0.808

Cites:

Cited by: 1

Related to: 10