Work

A systematic investigation of the structural and electrophysical properties formed under the influence of stoichiometry in CdTe thin films

Year: 2026

Type: article

Source: Physica B Condensed Matter

DOI: 10.1016/j.physb.2026.419292

Authors: I.O. Kosimov, B.D. Igamov, I.R. Bekpulatov, A.I. Kamardin, Sh.T. Khozhiev, F.N. Khurramova, Zh.B. Khuzhaniyazov, F.K. Khallokov, Hokman Mahmudov, Bahar Mammadova, Seljan Hajiyeva, Anar Aliyev, Gunel Imanova

Institutions: Academy of Sciences Republic of Uzbekistan, Karshi State University, Tashkent State Medical University, Tashkent State Technical University named after Islam Karimov, Bukhara State Medical Institute named after Abu Ali ibn Sino, Institute of Physics, Ministry of Science and Education Republic of Azerbaijan, Fizika İnstitutu Publik Hüquqi Şəxs, Khazar University, Azerbaijan University of Architecture and Construction

Language: English

Topic: Chalcogenide Semiconductor Thin Films

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7204901889

FWCI:

Cites: 15

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Related to: 10