Work

Focused ion-beam milling for field-ion specimen preparation:

Year: 1998

Type: article

Source: Ultramicroscopy

DOI: 10.1016/s0304-3991(98)00058-8

Authors: D.J Larson, D.T Foord, A.K Petford-Long, T.C Anthony, I.M Rozdilsky, A Cerezo, G.W.D Smith

Institutions: University of Oxford, University of Cambridge, Hewlett-Packard (United States)

Language: English

Topic: Advanced Materials Characterization Techniques

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W76528261

FWCI: 4.017

Cites: 30

Cited by: 99

Related to: 10