Work

Statistical AC Test Coverage.

Year: 1986

Type: conference-paper

Source: IEEE International Test Conference (ITC)

Authors: David Wu, Charles E. Radke, Jonathan Roth

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W8345157

FWCI: 0.415

Cites:

Cited by: 13

Related to: 10