Work

Power Aware Testing by Proper Don't Care Filling of Test Patterns

Year: 2013

Type: article

Authors: Oindrila Chakraborty, Parna Chakraborty, Priyanka Choudhury, Sambhu Nath Pradhan

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W95346902

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Cites: 9

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