Work

Fault Diagnosis of VLSI Circuits Using FPGA Technology.

Year: 2009

Type: article

Source: MSV

Authors: Badita KaliVaraPrasad, N. Rajeswaran, T. Madhu, Baylis Charles, P. Satish Kumar

Language: English

Topic: VLSI and Analog Circuit Testing

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W97463170

FWCI: 0.399

Cites:

Cited by: 1

Related to: 10