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Jan Schat

Observed name: J. Schat
Institution: NXP (Germany)
OpenAlex ID: A5001403174
ADC test methods using an impure stimulus: A survey
2018 · Jan Schat · IEEE European Test Symposium (ETS) · 11
Fault Clustering in deep-submicron CMOS Processes
2008 · Jan Schat · Design, Automation, and Test in Europe · 4
Core-Based Testing of Embedded Mixed-Signal Modules in a SoC
2009 · Vladimir A. Zivkovic, Jan Schat, et al. · IEEE Design & Test of Computers · 3
On the relationship between stuck-at fault coverage and transition fault coverage
2009 · J. Schat · Design, Automation, and Test in Europe · 3
Using the Thue-Morse Sequence to Cancel Low-Frequency Fluctuations
2007 · Jan Schat · Conference proceedings - IEEE Instrumentation/Measurement Technology Conference · 3
ISO26262-compliant soft-error mitigation in register banks
2017 · Jan Schat · IEEE European Test Symposium (ETS) · 2
Concurrent Estimation of a PLL Transfer Function by Cross-Correlation with pseudo-random Jitter
2019 · Jan Schat, Ulrich Mohlmann · IEEE European Test Symposium (ETS) · 1
On-line RF built-in self-test using noise injection and transmitter signal modulation by phase shifter
2018 · Jan Schat · Design, Automation, and Test in Europe
Soft-error detection in Register Files using circular scan
2017 · Jan Schat · International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
On the relationship between stuck-at fault coverage and transition fault coverage
2009 · Jan Schat · Design, Automation, and Test in Europe
Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns
2008 · Jan Schat · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Evaluation of the Iddq Signature in devices with Gauss-distributed background current
2008 · Jan Schat · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Testing low-resolution DACs using the Generalized Morse Sequence as Stimulus Sequence for Cancelling DC drift
2007 · Jan Schat · IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Simulation of SoCs with embedded mixed-signal Cores using a Verilog High-Speed Virtual Serial Interface
2006 · Jan Schat · IEEE International Conference on Electronics, Circuits and Systems (ICECS)
Fehlerkorrigierende Ultraschallmessung der Konzentration und Korngröße von suspendiertem Sand im Wasser
1994 · Jan Schat · tm - Technisches Messen
Works count: 15
Citation count: 27
H-index: 3
I10-index: 1
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