Author

Fabien Rozé

2022 · Toshiyuki Tabata, Fabien Rozé, et al. · Electronics · 21
2022 · Imen Karmous, Fabien Rozé, et al. · ECS Journal of Solid State Science and Technology · 10
2022 · Takeshi Nogami, Oleg Gluschenkov, et al. · IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) · 10
2021 · Toshiyuki Tabata, Pierre-Edouard Raynal, et al. · IEEE International Interconnect Technology Conference (IITC) · 10
2021 · Toshiyuki Tabata, Sebastien Halty, et al. · Applied Physics Express · 8
2016 · R. Berthelon, F. Andrieu, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 8
2022 · Toshiyuki Tabata, Fabien Rozé, et al. · Applied Physics Express · 7
2020 · Nicolas Jourdan, Fabien Roze, et al. · IEEE International Interconnect Technology Conference (IITC) · 7
2025 · Mathieu Opprecht, Sébastien Kerdilès, et al. · Physica Scripta · 5
2021 · Imen Karmous, Fabien Roze, et al. · ECS Transactions · 5
2024 · Mathieu Opprecht, Sébastien Kerdilès, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 4
2017 · F. Roze, P. Gergaud, et al. · IEEE Nanotechnology Materials and Devices Conference (NMDC) · 4
2021 · Toshiyuki Tabata, Fabien Roze, et al. · IEEE Journal of the Electron Devices Society · 3
2025 · Richard Daubriac, Leonardo Cancellara, et al. · Advanced Engineering Materials · 2
2023 · Lu Lu, Nicolas Jourdan, et al. · IEEE International Interconnect Technology Conference and IEEE Materials for Advanced Metallization Conference (IITC/MAM) · 2
2021 · Pierre Morin, Toshiyuki Tabata, et al. · International Conference on Solid State Devices and Materials (SSDM) · 2
2021 · Toshiyuki Tabata, Fabien Roze, et al. · International Workshop on Junction Technology · 2
2021 · Imen Karmous, Fabien Roze, et al. · ECS Meeting Abstracts · 2
2024 · Fulvio Mazzamuto, Zeinab Chehadi, et al. · Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena · 1
2022 · Remi Demoulin, Richard Daubriac, et al. · IEEE International Interconnect Technology Conference (IITC) · 1
Works count: 33
Citation count: 165
H-index: 8
I10-index: 6
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