Author

Yasushi KOKUBO

Observed names: Y. Kokubo, Y.Kokubo, Yasushi Kokubo

Observed institutions: JEOL (Japan), JEOL (United States)

OpenAlex ID: A5003446139

Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysis

1981 · Jun Hosoi, Tetsuo Oikawa, et al. · Ultramicroscopy · 33

Development of an Ultrahigh Vacuum High Resolution Scanning Transmission Electron Microscope

1993 · Yoshiyasu Harada, Takeshi Tomita, et al. · Journal of Electron Microscopy · 10

Thickness dependence of signal/background ratio of inner-shell electron excitation loss in eels

1984 · Jun Hosoi, Tetsuo Oikawa, et al. · Ultramicroscopy · 9

Digital image processing: A path to better pictures

1982 · Y. Kokubo, W.H. Hardy · Ultramicroscopy · 8

An application of secondary electrons to STEM imaging

1980 · Y. Kokubo, M. Inoue, et al. · Scanning · 5

Helium field ion source for application in a 100 keV focused ion beam system

1992 · Takahide Sakata, Kiyohito Kumagai, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 4

Fine Structure of Intestinal Fibroblasts: Autoradiographic and Three-Dimensional Studies

1988 · Kazushige HIROSAWA, Yasushi KOKUBO, et al. · Journal of Electron Microscopy · 4

Computed Deconvolution in Electron Energy Loss Spectroscopy (EELS)

1985 · Jun HOSOI, Tetsuo OIKAWA, et al. · Journal of Electron Microscopy · 4

Development of Field-Emission Gun for High-Voltage Electron Microscope

1990 · T. Tomita, S. Katoh, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2

An EELS Spectrometer with a Double Dispersion Lens for a Medium Voltage TEM

1986 · Tetsuo OIKAWA, Nobumasa SHIBATA, et al. · Journal of Electron Microscopy · 2

Digital Filtering in Electron Energy Loss Spectroscopy (EELS)

1985 · Jun HOSOI, Tetsuo OIKAWA, et al. · Journal of Electron Microscopy · 2

Elemental Filtergrams Obtained by Means of Electron Energy Analyzer Combined with Image Storage System

1982 · T. Oikawa, H. Sasaki, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2

Development of 100 kV Field Emission Scanning Electron Microscope

1974 · H. Koike, Y. Harada, et al. · Proceedings annual meeting Electron Microscopy Society of America · 2

Energy-Filtered CTEM Image of MgO Smoke Particles

1985 · Y. Kondo, T. Yoshioka, et al. · Proceedings annual meeting Electron Microscopy Society of America · 1

Construction of an energy filter for 200 kV CTEM

1985 · T. Oikawa, N. Ajika, et al. · Ultramicroscopy · 1

Computer Interfaced Electron Microscope

1983 · Y. Kokubo, S. Moriguchi, et al. · MRS Proceedings · 1

Combination of CBD and High Resolution with 400 kv

1983 · S. Suzuki, T. Honda, et al. · MRS Proceedings · 1

High Resolution Side-Entry Goniometer

1980 · T. Honda, H. Watanabe, et al. · Proceedings annual meeting Electron Microscopy Society of America · 1

An Application of Strongly Excited Objective Lens to Low Loss Image

1975 · Y. Kokubo, K. Ueno, et al. · Proceedings annual meeting Electron Microscopy Society of America · 1

A New Image Processing Technique for STEM

1974 · Yasushi Kokubo, Hirotami Koike, et al. · Proceedings annual meeting Electron Microscopy Society of America · 1

Development of a 300kV ultrahigh resolution analytical electron microscope

1991 · Kurio Fukushima, Yoshihiro Arai, et al. · Proceedings annual meeting Electron Microscopy Society of America

Design of a 400KV Ultrahigh-Resolution Analytical TEM

1990 · H. Tsuno, T. Honda, et al. · Proceedings annual meeting Electron Microscopy Society of America

Development of an Ultrahigh-Vacuum Ultrahigh-Resolution Scanning Electron Microscope

1990 · T. Tomita, Y. Kokubo, et al. · Proceedings annual meeting Electron Microscopy Society of America

An Application of 200kV Ultrahigh Resolution Analytical Electron Microscope

1990 · M. Suzuki, T. Kaneyama, et al. · Proceedings annual meeting Electron Microscopy Society of America

Development of a 300 kV ultrahigh resolution analytical electron microscope

1990 · Yoshihiro Arai, Kurio Fukushima, et al. · Microscopy Microanalysis Microstructures

PDF

Works count: 35

Citation count: 94

H-index: 5

I10-index: 2