Author

Kwangok Jeong

Observed names: Jeong, Kihyeok, K.T. Jeong, Kwang-Ok Jeong

Observed institutions: Korea University, Samsung (South Korea), University of California San Diego, Samsung Electronics (South Korea)

ORCID: 0009-0002-6830-9154

Observed ORCID: 0009-0002-6830-9154

OpenAlex ID: A5014444815

A power-constrained MPU roadmap for the International Technology Roadmap for Semiconductors (ITRS)

2009 · Kwangok Jeong, Andrew B. Kahng · International SoC Design Conference · 68

An MTCMOS design methodology and its application to mobile computing

2003 · Hyo-Sig Won, Kyo-Sun Kim, et al. · International Symposium on Low Power Electronics and Design (ISLPED) · 51

Accurate Machine-Learning-Based On-Chip Router Modeling

2010 · Kwangok Jeong, Andrew B. Kahng, et al. · IEEE Embedded Systems Letters · 43

Impact of Guardband Reduction On Design Outcomes: A Quantitative Approach

2009 · Kwangok Jeong, A.B. Kahng, et al. · IEEE Transactions on Semiconductor Manufacturing · 37

MAPG: Memory access power gating

2012 · Kwangok Jeong, A. B. Kahng, et al. · Design, Automation, and Test in Europe · 24

Methodology from chaos in IC implementation

2010 · Kwangok Jeong, Andrew B. Kahng · International Symposium on Quality Electronic Design (ISQED) · 23

Assessing chip-level impact of double patterning lithography

2010 · Kwangok Jeong, Andrew B. Kahng, et al. · International Symposium on Quality Electronic Design (ISQED) · 23

Quantified Impacts of Guardband Reduction on Design Process Outcomes

2008 · Kwangok Jeong, Andrew B. Kahng, et al. · International Symposium on Quality Electronic Design (ISQED) · 22

Interference assisted lithography for patterning of 1D gridded design

2009 · Robert T. Greenway, Rudolf Hendel, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 21

Revisiting the linear programming framework for leakage power vs. performance optimization

2009 · Kwangok Jeong, Andrew B. Kahng, et al. · International Symposium on Quality Electronic Design (ISQED) · 20

Is overlay error more important than interconnect variations in double patterning?

2009 · Kwangok Jeong, Andrew B. Kahng, et al. · International Workshop on System Level Interconnect Prediction (SLIP) · 19

Timing Yield-Aware Color Reassignment and Detailed Placement Perturbation for Bimodal CD Distribution in Double Patterning Lithography

2010 · Mohit Gupta, Kwangok Jeong, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 17

Timing analysis and optimization implications of bimodal CD distribution in double patterning lithography

2009 · Kwangok Jeong, Andrew B. Kahng · 17

32nm 1-D regular pitch SRAM bitcell design for interference-assisted lithography

2008 · Robert T. Greenway, Kwangok Jeong, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 16

Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography

2009 · Mohit Gupta, Kwangok Jeong, et al. · 15

Electrical metrics for lithographic line-end tapering

2008 · Puneet Gupta, Kwangok Jeong, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 13

Timing analysis and optimization implications of bimodal CD distribution in double patterning lithography

2009 · Kwangok Jeong, Andrew B. Kahng · Asia and South Pacific Design Automation Conference (ASP-DAC) · 10

Dose map and placement co-optimization for timing yield enhancement and leakage power reduction

2008 · Kwangok Jeong, Andrew B. Kahng, et al. · ACM/IEEE Design Automation Conference (DAC) · 8

Synthesis of Hardware Performance Monitoring and Prediction Flow Adapting to Near-Threshold Computing and Advanced Process Nodes

2020 · Jeongwoo Heo, Kwangok Jeong, et al. · Asia and South Pacific Design Automation Conference (ASP-DAC) · 7

Development of Fine Pitch Backside Redistribution Layer (BRDL) Process in Fan Out Panel Level Packaging (FOPLP)

2023 · Hyunju Lee, Sung Keun Park, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 6

MTCMOS Post-Mask Performance Enhancement

2004 · Kyosun Kim, Hyo-Sig Won, et al. · 6

Realization of high A/R and fine pitch Cu pillars incorporating high speed electroplating with novel strip process

2022 · Se-Chul Park, Jong-Ho Park, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 5

Stability and scalability in global routing

2011 · Sung Kyu Han, Kwangok Jeong, et al. · International Workshop on System Level Interconnect Prediction (SLIP) · 5

New yield-aware mask strategies

2011 · Kwangok Jeong, Andrew B. Kahng, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 5

Electrical assessment of lithographic gate line-end patterning

2010 · Puneet Gupta, Kwangok Jeong, et al. · Journal of Micro/Nanopatterning Materials and Metrology · 5

Works count: 41

Citation count: 512

H-index: 15

I10-index: 17