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Bharath Nandakumar

Improving Diagnosis Resolution and Performance at High Compression Ratios
2018 · Sameer Chillarige, Atul Chhabra, et al. · IEEE International Test Conference (ITC) · 5
Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification
2020 · Bharath Nandakumar, Sameer Chillarige, et al. · IEEE International Test Conference (ITC) · 3
Machine Learning Driven Throughput Optimization of Volume Diagnosis Methodology
2020 · Sameer Chillarige, Anil Malik, et al. · IEEE International Test Conference India (ITC India) · 3
PPA Optimization of Test Points in Automotive Designs
2022 · Brian Foutz, Sarthak Singhal, et al. · IEEE International Test Conference (ITC) · 2
Scaling physically aware logic diagnosis to complex high volume 7nm server processors
2022 · Bharath Nandakumar, Madhur Maheshwari, et al. · IEEE International Test Conference (ITC) · 2
Accurate Diagnosis of Cell Internal Defects with Multiple Excitation and Propagation Conditions
2022 · Sonam Kathpalia, Sameer Chillarige, et al. · IEEE International Test Conference India (ITC India) · 2
High Throughput Multiple Device Chain Diagnosis Methodology for Clock and Control Line Defects
2021 · Bharath Nandakumar, Sameer Chillarige, et al. · IEEE Microelectronics Design & Test Symposium (MDTS) · 2
High Throughput Chain Diagnosis Methodology with Minimal Failure Data Collection
2019 · Sameer Chillarige, Anil Malik, et al. · IEEE International Test Conference India (ITC India) · 2
Improved Diagnosis Methodology for Multi-Defect Scenarios in High Compression Scan based Designs
2019 · Bharath Nandakumar, Anil Malik, et al. · IEEE International Test Conference India (ITC India) · 1
Pseudo-Random Low Power Built In Self Test
2025 · Dale Meehl, Sameer Chillarige, et al. · IEEE International Test Conference (ITC)
High performance advanced fault model diagnosis
2024 · Vaibhav Mishra, Bharath Nandakumar, et al. · Proceedings - Asian Test Symposium/Proceedings
High Throughput Multiple Device Diagnosis System for Hierarchical Test Designs
2024 · Atul Chhabra, Bharath Nandakumar, et al. · Lecture notes in electrical engineering
Low cost production scan chain test for compression based designs
2023 · Bharath Nandakumar, Sameer Chillarige · IEEE International Test Conference (ITC)
Addressing Physically Aware Diagnosis Challenges in Hierarchical Core Based Designs
2023 · Bharath Nandakumar, Sameer Chillarige, et al. · IEEE International Test Conference India (ITC India)
Infinity printer
2013 · Kiran Rajmohan, R. S. Anand, et al. · Computer and Information Technology
Infinity printer
2013 · Kiran Rajmohan, R Anand, et al. · World Congress on Computer and Information Technology (WCCIT)
Works count: 16
Citation count: 22
H-index: 3
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