Author

Rudolf Moellers

Observed names: Moellers, R., Moellers, Rudolf, R. Moellers

OpenAlex ID: A5036504420

The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power

2017 · Melissa K Passarelli, Alexander Pirkl, et al. · Nature Methods · 475

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

2012 · Alexander G. Shard, Rasmus Havelund, et al. · Analytical Chemistry · 149

Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples

2013 · Claudia Bich, Rasmus Havelund, et al. · Analytical Chemistry · 95

Dual beam depth profiling of polymer materials: comparison of C 60 and Ar cluster ion beams for sputtering

2012 · D. Rading, R. Moellers, et al. · Surface and Interface Analysis · 75

Depth profiling of organic materials using improved ion beam conditions

2008 · H.-G. Cramer, T. Grehl, et al. · Applied Surface Science · 51

Surface spectrometry using large argon clusters

2012 · S. Kayser, D. Rading, et al. · Surface and Interface Analysis · 39

TOF‐SIMS depth profiling of multilayer amino‐acid films using large Argon cluster Ar n + , C 60 + and Cs + sputtering ions: A comparative study

2012 · N. Wehbe, T. Tabarrant, et al. · Surface and Interface Analysis · 21

Dual beam depth profiling of organic materials: Variations of analysis and sputter beam conditions

2010 · D. Rading, R. Moellers, et al. · Surface and Interface Analysis · 21

Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers

2013 · N. Wehbe, T. Mouhib, et al. · Analytical and Bioanalytical Chemistry · 13

In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

2014 · Ewald Niehuis, Rudolf Moellers, et al. · Microscopy and Microanalysis · 12

MCs + depth profiling using cluster primary ions

2010 · E. Niehuis, T. Grehl, et al. · Surface and Interface Analysis · 11

A Novel Hybrid Dual Analyzer SIMS Instrument for Improved Surface and 3D-Analysis

2016 · Alexander Pirkl, Rudolf Moellers, et al. · Microscopy and Microanalysis · 9

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Dual beam depth profiling of organic materials: assessment of capabilities and limitations

2014 · Ewald Niehuis, Rudolf Moellers, et al. · Surface and Interface Analysis · 7

Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces

2020 · Felix Kollmer, Alexander Pirkl, et al. · Microscopy and Microanalysis · 1

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TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

2018 · Felix Kollmer, Nathan Havercroft, et al. · Microscopy and Microanalysis · 1

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Label-free Imaging of Biomolecules in Murine Brain Sections Using the 3D OrbiSIMS

2017 · Ian Gilmore, Rasmus Havelund, et al. · Protocol Exchange · 1

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Novel Cluster Ion Beams For Secondary Ion Generation, Sputtering And FIB/SIMS Application

2012 · F. Kollmer, D. Rading, et al. · Microscopy and Microanalysis · 1

The 3D OrbiSIMS – Label-Free Metabolic Imaging with Sub-cellular Lateral Resolution and High Mass Resolving Power

2017 · Gilmore, Ian, Passarelli, Melissa, et al. · Figshare

Sputtering with large On+ cluster projectiles on inorganic surfaces

2015 · Claudia Fleischmann, Thierry Conard, et al.

Depth Profiling and Interface Analysis by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS): Potential, Performance and Limitations.

2006 · Corey C. Foster, Sven Kayser, et al. · Bulletin of the American Physical Society

Works count: 23

Citation count: 982

H-index: 11

I10-index: 11