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Hee-Wook You

Observed names: H. W. You, HEE-WOOK YOU, Hee-wook You
OpenAlex ID: A5036908480
Charge trapping properties of the HfO2 layer with various thicknesses for charge trap flash memory applications
2010 · Hee-Wook You, Won-Ju Cho · Applied Physics Letters · 158
Structural and Electrical Properties of Low Temperature Sintered Li2CO3 Doped (Ba,Sr)TiO3 Ceramics
2006 · Hee-Wook You, Jung-Hyuk Koh · Japanese Journal of Applied Physics · 27
Low operation voltage and high thermal stability of a WSi2 nanocrystal memory device using an Al2O3/HfO2/Al2O3 tunnel layer
2012 · Dong Uk Lee, Hyo Jun Lee, et al. · Applied Physics Letters · 18
Nonvolatile Poly-Si TFT Charge-Trap Flash Memory With Engineered Tunnel Barrier
2011 · Hee-Wook You, Won-Ju Cho · IEEE Electron Device Letters · 15
Thickness dependence of high-k materials on the characteristics of MAHONOS structured charge trap flash memory
2010 · Hee-Wook You, Se-Man Oh, et al. · Thin Solid Films · 13
Electrical properties of HfO2 charge trap flash memory with SiO2/HfO2/Al2O3 engineered tunnel layer
2009 · Se-Man Oh, Hee-wook You, et al. · Current Applied Physics · 10
Microstructure and dielectric properties of Li2CO3 doped 0.7(Ba,Sr)TiO3–0.3MgO ceramics
2008 · Hee-Wook You, Sang-Mo Koo, et al. · Current Applied Physics · 9
LOW TEMPERATURE SINTERING OF Li2CO3 ADDED (Ba,Sr)TiO3 CERAMICS
2006 · HEE-WOOK YOU, JUNG-HYUK KOH · Integrated ferroelectrics · 9
Application of nanosphere lithography to charge trap flash memories with patterned Si3N4 trap layers
2012 · Ho-Myoung An, Hee-Dong Kim, et al. · Microelectronic Engineering · 5
Electrical characteristics of a ZrO2/SiO2 modified tunnel barrier for low-temperature non-volatile memory
2011 · Hee-Wook You, Won-Ju Cho · Thin Solid Films · 5
Engineering of tunnel barrier for highly integrated nonvolatile memory applications
2011 · Hee-Wook You, Jung-Woo Son, et al. · Applied Physics A · 5
Electrical Characteristics of WSi2Nanocrystal Capacitors with Barrier-Engineered High-k Tunnel Layers
2011 · Hyo Jun Lee, Dong Uk Lee, et al. · Japanese Journal of Applied Physics · 4
Multi-layer stacked OHA and AHA tunnel barriers for charge trap flash non-volatile memory application
2011 · Jung-Woo Son, Hee-Wook You, et al. · Current Applied Physics · 3
Electrical properties of WSi2 nanocrystal memory with SiO2/Si3N4/SiO2 tunnel barriers
2009 · Ki Bong Seo, Dong Uk Lee, et al. · Current Applied Physics · 3
Simulation and Fabrication of Embedded Capacitors for Organic-based Rf System on Package Applications
2008 · Hee-Wook You, Jae-Yong Park, et al. · Integrated ferroelectrics · 3
Ag(Ta,Nb)O3 thin-film interdigital capacitors for microwave applications
2007 · Hee-Wook You, Jung-Hyuk Koh · Microelectronics Journal · 3
Thermal Stability of Metal-Silicide Nanocrystal Nonvolatile Memory with Barrier Engineered Tunnel Layers
2011 · Dong Uk Lee, Seon Pil Kim, et al. · Journal of Nanoscience and Nanotechnology · 2
Charge loss in WSi2 nanocrystals nonvolatile memory with SiO2/Si3N4/SiO2 tunnel layer
2011 · Dong Uk Lee, Hyo Jun Lee, et al. · Current Applied Physics · 2
Comparative Analysis of Li2CO3Doped (Ba,Sr)TiO3and ZnBO Doped (Ba,Sr)TiO3Ceramics for the Low Temperature Sintering Applications
2009 · Se-Ho Kim, Hee-Wook You, et al. · Ferroelectrics · 2
Simulation and Fabrication of Embedded Capacitors in the Multilayer Printed Circuit Board
2008 · Hee-Wook You, Se-Ho Kim, et al. · Japanese Journal of Applied Physics · 2
Speed Enhancement of WSi2 Nanocrystal Memory with Barrier-Engineered Si3N4/HfAlO Tunnel Layer
2012 · Dong Uk Lee, Hyo Jun Lee, et al. · Japanese Journal of Applied Physics · 1
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Nonvolatile-Memory Characteristics of SiC Nanocrystals with Variable Oxide Thickness and Crested Tunnel Barriers
2011 · Dong Seok Han, Dong Uk Lee, et al. · Journal of Nanoscience and Nanotechnology · 1
Electrical Characteristics of WSi2Nanocrystal Capacitors with Barrier-Engineered High-kTunnel Layers
2011 · Hyo Jun Lee, Dong Uk Lee, et al. · Japanese Journal of Applied Physics · 1
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Electrical properties of HfO 2 charge trap flash memory with SiO 2/HfO 2/Al 2O 3 engineered tunnel layer
2010 · Se-Man Oh, Hee-Wook You, et al. · 1
THE ELECTRICAL AND STRUCTURAL PROPERTIES OF Li2CO3 DOPED 0.7(Ba,Sr)TiO3-0.3MgO CERAMICS
2007 · HEE-WOOK YOU, JUNG-HYUK KOH · Integrated ferroelectrics · 1
Works count: 32
Citation count: 303
H-index: 8
I10-index: 6
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