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L. Bideux
Observed names:
Bideux Luc,
Bideux, L.,
Bideux, Luc,
L Bideux,
Luc Bideux,
Luc, Bideux
show all 6
Institution:
Institut Pascal
Observed institutions:
Lyon 1 Université,
Centre National de la Recherche Scientifique,
Institut Pascal,
Université Clermont Auvergne,
Sigma Clermont,
Clermont Auvergne INP,
Université Blaise Pascal
show all 7
ORCID:
0000-0002-7280-8565
Observed ORCID:
0000-0002-7280-8565
OpenAlex ID:
A5037047341
Characterization of interface states at Au/InSb/InP(100) Schottky barrier diodes as a function of frequency
2000
·
B. Akkal
, Z. Benamara
, et al.
·
Vacuum
·
133
Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy
2010
·
Matthieu Manceau
, Julien Gaume
, et al.
·
Thin Solid Films
·
103
Record Pure Zincblende Phase in GaAs Nanowires down to 5 nm in Radius
2014
·
Evelyne Gil
, Vladimir G. Dubrovskii
, et al.
·
Nano Letters
·
94
Modelization and characterization of Au/InSb/InP Schottky systems as a function of temperature
1998
·
B. Akkal
, Z. Benamara
, et al.
·
Materials Science and Engineering B
·
79
Synthesis and Study of Stable and Size-Controlled ZnO–SiO2 Quantum Dots: Application as a Humidity Sensor
2016
·
Mohamed Aymen Mahjoub
, Guillaume Monier
, et al.
·
The Journal of Physical Chemistry C
·
65
Fast Growth Synthesis of GaAs Nanowires with Exceptional Length
2010
·
M. R. Ramdani
, E. Gil
, et al.
·
Nano Letters
·
55
Nitridation of GaAs(1 0 0) substrates and Ga/GaAs systems studied by XPS spectroscopy
2003
·
Y. Ould-Metidji
, L. Bideux
, et al.
·
Applied Surface Science
·
32
Experimental system for GaN thin films growth and in situ characterisation by electron spectroscopic methods
2004
·
V. Matolı́n
, S. Fabı́k
, et al.
·
Vacuum
·
31
Analysis and simulation of Au/InSb/InP diode C–V characteristic: modeling and experiments
2002
·
B Akkal
, Z Benamara
, et al.
·
Materials Science and Engineering C
·
31
Passivation of GaAs(001) surface by the growth of high quality c-GaN ultra-thin film using low power glow discharge nitrogen plasma source
2012
·
G. Monier
, L. Bideux
, et al.
·
Surface Science
·
30
Electrical characterization of the Au/InP(100) and Au/InSb/InP(100) structures
1999
·
B. Akkal
, Z. Benamara
, et al.
·
Microelectronics Journal
·
27
Effects of the GaN layers and the annealing on the electrical properties in the Schottky diodes based on nitrated GaAs
2015
·
A.H. Kacha
, B. Akkal
, et al.
·
Superlattices and Microstructures
·
26
Combined angle-resolved X-ray photoelectron spectroscopy, density functional theory and kinetic study of nitridation of gallium arsenide
2017
·
H. Mehdi
, G. Monier
, et al.
·
Applied Surface Science
·
25
Simulation and Experimental Studies of Illumination Effects on the Current Transport of Nitridated GaAs Schottky Diode
2018
·
A. Rabehi
, M. Amrani
, et al.
·
Semiconductors
·
19
XPS study of the formation of ultrathin GaN film on GaAs(100)
2008
·
L. Bideux
, G. Monier
, et al.
·
Applied Surface Science
·
18
New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images
2014
·
Mohamed Aymen Mahjoub
, Guillaume Monier
, et al.
·
Journal of Electron Spectroscopy and Related Phenomena
·
17
A study of the 42CrMo4 steel surface by quantitative XPS electron spectroscopy
2008
·
M. Flori
, B. Gruzza
, et al.
·
Applied Surface Science
·
17
Structural and electrical study of 〈Au/InP(100)〉 and 〈Au/InSb/InP(100)〉 systems
1993
·
L. Bideux
, B. Gruzza
, et al.
·
Surface and Interface Analysis
·
17
Electrical parameters evolution of Au/InP(100) and Au/InSb/InP(100) systems with restructuring conditions
2002
·
Z Benamara
, B Akkal
, et al.
·
Materials Science and Engineering C
·
16
Effect of surface roughness on EPES and AREPES measurements: Flat and crenels silicon surfaces
2008
·
S. Chelda
, C. Robert-Goumet
, et al.
·
Surface Science
·
15
Study of InP(100) surface nitridation by x‐ray photoelectron spectroscopy
2002
·
L. Bideux
, Y. Ould‐Metidji
, et al.
·
Surface and Interface Analysis
·
15
A Monte Carlo study for electron elastic backscattering based on layered models for substrates
1998
·
C. Robert
, B. Gruzza
, et al.
·
Mathematics and Computers in Simulation
·
15
Electrons elastically backscattered from Al, Ag and Au samples
1998
·
B Gruzza
, C Robert
, et al.
·
Vacuum
·
15
Retarding field analyser used in elastic peak electron spectroscopy
1997
·
D Zeze
, L Bideux
, et al.
·
Vacuum
·
15
Nitridation of InP(100) substrates studied by XPS spectroscopy and electrical analysis
2006
·
A. Talbi
, Z. Benamara
, et al.
·
Materials Science and Engineering A
·
14
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Works count:
117
Citation count:
1,321
H-index:
17
I10-index:
40
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