Author

P. Roumanille

2021 · E. Ben Romdhane, P. Roumanille, et al. · Microelectronics Reliability · 35
2021 · Pierre Roumanille, Emna Ben Romdhane, et al. · Microelectronics Reliability · 28
2021 · E. Ben Romdhane, P. Roumanille, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 14
2023 · P. Roumanille, J. Lesseur, et al. · Microelectronics Reliability · 8
2022 · E. Ben Romdhane, P. Roumanille, et al. · International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) · 7
2022 · E. Ben Romdhane, P. Roumanille, et al. · IEEE Electronic Components and Technology Conference (ECTC) · 5
2014 · J J Boy, M. Allani, et al. · European Frequency and Time Forum · 5
2016 · P. Roumanille, V. Baco, et al. · IEEE Nanotechnology Materials and Devices Conference (NMDC)
2016 · P. Roumanille, Valérie Baco-Carles, et al. · Open Archive Toulouse Archive Ouverte (University of Toulouse)
Works count: 15
Citation count: 148
H-index: 7
I10-index: 5
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