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Christophe Poulain

Deviations from the Paschen's law at short gap distances from 100 nm to 10 μ m in air and nitrogen
2014 · A. Peschot, N. Bonifaci, et al. · Applied Physics Letters · 88
Field emission and material transfer in microswitches electrical contacts
2010 · M. Vincent, S. W. Rowe, et al. · Applied Physics Letters · 40
CIGS solar cells on ultra-thin glass substrates: Determination of mechanical properties by nanoindentation and application to bending-induced strain calculation
2016 · Arnaud Gerthoffer, Christophe Poulain, et al. · Solar Energy Materials and Solar Cells · 39
Total Harmonic Distortion of a Piezoelectric MEMS Loudspeaker in an IEC 60318-4 Coupler Estimation Using Static Measurements and a Nonlinear State Space Model
2021 · Romain Liechti, Stéphane Durand, et al. · Micromachines · 24
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A Nano-Scale Investigation of Material Transfer Phenomena at Make in a MEMS Switch
2011 · Christophe Poulain, Alexis Peschot, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 19
Contact degradation due to material transfer in MEM switches
2012 · A. Peschot, C. Poulain, et al. · Microelectronics Reliability · 17
Microstructure evolution of gold thin films under spherical indentation for micro switch contact applications
2011 · Brice Arrazat, Vincent Mandrillon, et al. · Journal of Materials Science · 15
Characterization of photoresist films exposed to high-dose implantation conditions
2017 · Marion Croisy, Erwine Pargon, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 12
Impact of the resist properties on the antisticking layer degradation in UV nanoimprint lithography
2010 · A. Francone, C. Iojoiu, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 12
Experimental and theoretical study of creep effects in electrical contacts
2002 · C. Poulain, L. Boyer, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 12
Resilience to Vibration of a Tuning Fork MEMS Gyroscope
2016 · Alexandra Koumela, Christophe Poulain, et al. · Procedia Engineering · 11
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Characterization and modeling of a piezoresistive three-axial force micro sensor
2013 · N. Alcheikh, C. Coutier, et al. · Sensors and Actuators A Physical · 11
Silver nanoparticle inkjet printed 17 GHz filter
2013 · D. Sette, A. Blayo, et al. · IEEE MTT-S International Microwave Symposium digest · 11
Contact Bounce Phenomena in a MEM Switch
2012 · Alexis Peschot, Christophe Poulain, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 10
KNN lead-free technology on 200 mm Si wafer for piezoelectric actuator applications
2024 · Hugo Kuentz, Christel Dieppedale, et al. · Sensors and Actuators A Physical · 9
Electrical breakdown voltage in micro- and submicrometer contact gaps (100nm - 10µm) in air and nitrogen
2015 · Alexis Peschot, Christophe Poulain, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 9
An experimental method to determine the resistance of a vertically aligned carbon nanotube forest in contact with a conductive layer
2012 · T. T. Vo, C. Poulain, et al. · Journal of Applied Physics · 9
Flexible Hybrid Electronics Including Ultrathin Strain Sensors or Radio Frequency Identification Dies Manufactured on Wafer Silicon Carrier
2023 · J.-C. Souriau, C. Poulain, et al. · IEEE Transactions on Components Packaging and Manufacturing Technology · 7
Thermal Piezoresistive Back Action Enhancement Using an Innovative Design of Silicon Nanobeam
2019 · Pierre Janioud, Alexandra Koumela, et al. · IEEE International Conference on Micro Electro Mechanical Systems (MEMS) · 7
Micro Pirani pressure sensor fabricated by inkjet printing of silver nanoparticles
2013 · D. Sette, D. Mercier, et al. · International Conference on Solid-State Sensors, Actuators and Microsystems · 7
Performance Limits of Nanoelectromechanical Switches (NEMS)-Based Adiabatic Logic Circuits
2013 · Samer Houri, Christophe Poulain, et al. · Journal of Low Power Electronics and Applications · 6
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Impact of Creep and Softening Mechanisms on the Contact Resistance of RF MEMS Ohmic Switches: Study of the Current and Time Effects on Au-to-Au Microcontacts in Static Contact Conditions
2010 · Frederic Souchon, Alexis Peschot, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 6
Future challenges and opportunities for heterogeneous process technology. Towards the thin films, Zero Intrinsic Variability devices, Zero Power era
2014 · S. Deleonibus, O. Faynot, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 5
An Original Apparatus for Endurance Testing of MEMS Electrical Contact Materials
2009 · Maxime Vincent, Laurent Chiesi, et al. · IEEE Holm Conference on Electrical Contacts (HOLM) · 5
Effect of electrically induced cracks on the properties of PZT thin film capacitors
2022 · Hugo Kuentz, Baba Wagué, et al. · Applied Physics Letters · 4
Works count: 83
Citation count: 444
H-index: 11
I10-index: 14
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