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Cheng-Hsu Chou

Enhanced Current Drive of Double-Gate $\alpha$-IGZO Thin-Film Transistors
2013 · Tsang-Long Chen, Kuan-Chang Huang, et al. · IEEE Electron Device Letters · 46
Mobility Enhancement of Back-Channel-Etch Amorphous InGaZnO TFT by Double Layers With Quantum Well Structures
2019 · An-Hung Tai, Chia-Chun Yen, et al. · IEEE Transactions on Electron Devices · 41
Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure
2013 · Tien-Yu Hsieh, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 36
Oxygen-related Reliability of Amorphous InGaZnO Thin Film Transistors
2020 · Chia-Chun Yen, An-Hung Tai, et al. · IEEE Journal of the Electron Devices Society · 29
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Negative bias temperature instability (NBTI) in deep sub-micron p/sup +/-gate pMOSFETs
2002 · Y.F. Chen, M.H. Lin, et al. · IEEE International Integrated Reliability Workshop final report · 26
Investigation of carrier transport behavior in amorphous indium–gallium–zinc oxide thin film transistors
2015 · Po-Yung Liao, Ting-Chang Chang, et al. · Japanese Journal of Applied Physics · 16
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Highly efficient tandem organic light-emitting devices utilizing the connecting structure based on n-doped electron-transport layer/HATCN/hole-transport layer
2014 · Yi-Lin Wu, Chien-Yu Chen, et al. · Applied Optics · 16
High-Performance Solution-Processed ZnSnO TFTs with Tunable Threshold Voltages
2015 · Shiao-Po Tsai, Ching-Hsiang Chang, et al. · ECS Journal of Solid State Science and Technology · 15
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Performance Improvement by Double-Layer a-IGZO TFTs With a Top Barrier
2021 · Jih-Chao Chiu, Song-Ling Li, et al. · IEEE Journal of the Electron Devices Society · 14
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Mobility Enhancement and Abnormal Humps in Top-Gate Self-Aligned Double-Layer Amorphous InGaZnO TFTs
2022 · Ming-Xuan Lee, Jih-Chao Chiu, et al. · IEEE Journal of the Electron Devices Society · 10
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Abnormal Threshold Voltage Shift of Amorphous InGaZnO Thin-Film Transistors Due to Mobile Sodium
2016 · Chieh Lo, Zheng-Lun Feng, et al. · IEEE Journal of the Electron Devices Society · 10
Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors
2013 · Tien-Yu Hsieh, Ting-Chang Chang, et al. · IEEE Transactions on Electron Devices · 10
The suppressed negative bias illumination-induced instability in In-Ga-Zn–O thin film transistors with fringe field structure
2012 · Yu-Chun Chen, Ting-Chang Chang, et al. · Applied Physics Letters · 10
Investigation of Hydration Reaction-Induced Protons Transport in Etching-Stop a-InGaZnO Thin-Film Transistors
2015 · Jhe-Ciou Jhu, Ting-Chang Chang, et al. · IEEE Electron Device Letters · 8
Mechanisms of ZnO buffer layer in bottom gate ZnO:Al transparent thin film transistors
2012 · Yung-Hao Lin, Hsin-Ying Lee, et al. · Materials Chemistry and Physics · 8
Enhancements of electrical properties and positive bias instability in self-aligned top-gate a-IGZO TFTs by hydrogen incorporation
2024 · Yuan-Ming Liu, Jih-Chao Chiu, et al. · Semiconductor Science and Technology · 6
Mobility Enhancement of BCE-Type Amorphous InGaZnO TFTs Using Triple-Layer Channels
2023 · Jih-Chao Chiu, Yuan-Ming Liu, et al. · IEEE Transactions on Electron Devices · 6
Ultrahigh Sensitivity Self-Amplification Phototransistor Achieved by Automatic Energy Band Lowering Behavior
2014 · Hua-Mao Chen, Ting-Chang Chang, et al. · IEEE Transactions on Electron Devices · 5
Investigating degradation behavior of hole-trapping effect under static and dynamic gate-bias stress in a dual gate a-InGaZnO thin film transistor with etch stop layer
2016 · Po-Yung Liao, Ting-Chang Chang, et al. · Thin Solid Films · 3
ZnO:Al based transparent thin film transistors
2008 · Ching-Ting Lee, Wen-Ming Shien, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS) · 2
Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency Noise Analysis
2025 · Y. K. Chang, P. J. Liao, et al. · IEEE International Reliability Physics Symposium proceedings · 1
(Digital Presentation) Negative Bias Illumination Stress on a-Igzo TFT with a Top Barrier
2022 · Jih-Chao Chiu, Eknath Sarkar, et al. · ECS Meeting Abstracts · 1
Double-Layer Amorphous InGaZnO Thin Film Transistors with High Mobility and High Reliability
2021 · Song-Ling Li, Ming-Xuan Lee, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 1
Stability and performance enhancement of a-IGZO TFTs by H incorporation
2026 · Hsien-Ming Sung, Yuan-Ming Liu, et al. · Applied Physics Letters
Reliability Study of Self-Aligned Top-Gated a-IGZO TFTs by N2 and N2O Plasma Treatment
2025 · Yuan-Ming Liu, Hsien-Ming Sung, et al. · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
Works count: 25
Citation count: 320
H-index: 10
I10-index: 13
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