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André Lange

A general approach for multivariate statistical MOSFET compact modeling preserving correlations
2011 · Andre Lange, Christoph Sohrmann, et al. · European Solid-State Device Research Conference · 16
Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters
2015 · Andre Lange, Christoph Sohrmann, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 14
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High-Voltage Amplifier Design for MEMS based Switching Arrays in Wavelength-Division Multiplexing Networks
2007 · Steffen Heinz, Andre Lange, et al. · IEEE International Symposium on Industrial Electronics (ISIE) · 12
Time Dependent Isolation Capability of High Voltage Deep Trench Isolation
2008 · Ralf Lerner, Uwe Eckoldt, et al. · IEEE International Symposium on Power Semiconductor Devices and ICs/Proceedings of the International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices & ICs/Proceedings of the ... International Symposium on Power Semiconductor Devices and ICs · 11
Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits
2019 · André Lange, Fabio A. Velarde Gonzalez, et al. · European Solid-State Device Research Conference · 10
A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
2022 · André Lange, Fabio A. Velarde Gonzalez, et al. · Microelectronics Reliability · 9
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Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation
2018 · A. Clausner, S. Schlipf, et al. · IEEE International Reliability Physics Symposium proceedings · 7
Challenges and solution approaches for simulation-based reliability assessment – degradation modeling
2020 · Andre Lange, Roland Jancke · IEEE International Integrated Reliability Workshop final report · 5
BTI variability of SRAM cells under periodically changing stress profiles
2016 · Kay-Uwe Giering, Andre Lange, et al. · IEEE International Integrated Reliability Workshop final report · 5
Probabilistic standard cell modeling considering non-gaussian parameters and correlations
2014 · André Lange, Christoph Sohrmann, et al. · Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft) · 5
Fitting standard cell performance to generalized Lambda distributions
2011 · André Lange, Joachim Haase, et al. · ACM Great Lakes Symposium on VLSI (GLSVLSI) · 5
Modeling the Leakage Current of Dielectric Isolation Structures in a High-Voltage Semiconductor Technology
2007 · Andre Lange, Steffen Heinz, et al. · IEEE International Symposium on Industrial Electronics (ISIE) · 5
Variability-aware compact model strategy for 20-nm bulk MOSFETs
2014 · Xingsheng Wang, Dave Reid, et al. · International Conference on Simulation of Semiconductor Processes and Devices · 4
On the Interpolation from Transistor Figures of Merit to Compact Model Parameters
2022 · Lukas Hahne, Jakob Wagner, et al. · IFAC-PapersOnLine · 3
ReliaVision: In-circuit transistor reliability investigation using XML-based technology reliability information in PDKs
2021 · Lukas Hahne, G. Fabio A. Velarde, et al. · IEEE International Integrated Reliability Workshop final report · 3
Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments
2018 · J. Warmuth, K.-U. Giering, et al. · European Solid-State Device Research Conference · 3
Probabilistic standard cell modeling considering non-Gaussian parameters and correlations
2014 · Andre Lange, Christoph Sohrmann, et al. · Design, Automation, and Test in Europe · 3
Towards probabilistic analog behavioral modeling
2015 · Andre Lange, Ihor Harasymiv, et al. · IEEE International Symposium on Circuits and Systems proceedings · 2
Hybrid Dynamical Systems for Memristor Modelling
2014 · Joachim Haase, André Lange · Lecture notes in electrical engineering · 2
RF small-signal modeling of HCI degradation in FDSOI NMOSFET using BSIM-IMG
2021 · Fabio A. Velarde Gonzalez, Andre Lange, et al. · IEEE International Integrated Reliability Workshop final report · 1
Hybrid dynamical systems for memristor modelling: An approach avoiding the terminal-state problem
2013 · Haase, Joachim, Lange, André · Fraunhofer-Publica (Fraunhofer-Gesellschaft) · 1
Methods of Parameter Variations
2011 · Christoph Knoth, Ulf Schlichtmann, et al. · Springer eBooks · 1
Design Support for Reliable Integrated Circuits
2024 · Sonja Crocoll, André Lange · Springer eBooks
Supporting analog design for reliability by efficient provision of reliability information to designers
2023 · Fabio A. Velarde Gonzalez, Lukas Hahne, et al. · IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Surrogate-Based Modeling Techniques for Mapping Transistor Figures of Merit onto Compact Model Parameters
2022 · Fabio A. Velarde Gonzalez, Jose L. Chavez-Hurtado, et al. · IEEE International Integrated Reliability Workshop final report
Works count: 73
Citation count: 128
H-index: 7
I10-index: 5
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