Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Mehdi Katoozi
Observed name:
M. Katoozi
Institutions:
Boeing (United States),
Purdue University West Lafayette
Observed institutions:
Boeing (United States),
Purdue University West Lafayette
OpenAlex ID:
A5044513450
Single event phenomena in atmospheric neutron environments
1993
·
C.A. Gossett
, B.W. Hughlock
, et al.
·
IEEE Transactions on Nuclear Science
·
78
A compact SPICE model for statistical post-breakdown gate current increase due to TDDB
2013
·
Soo Youn Kim
, G. Panagopoulos
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
20
Built-in testable error detection and correction
1992
·
M. Katoozi
, A.W. Nordsieck
·
IEEE Journal of Solid-State Circuits
·
8
Accelerated BTI degradation under stochastic TDDB effect
2018
·
Devyani Patra
, Ahmed Kamal Reza
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
7
A testable CMOS synchronous counter
1988
·
M. Katoozi
, M. Soma
·
IEEE Journal of Solid-State Circuits
·
7
Compact modeling and simulation of accelerated circuit aging
2018
·
Devyani Patra
, Jiayang Zhang
, et al.
·
Custom Integrated Circuits Conference
·
6
An age-aware library for reliability simulation of digital ICs
2013
·
M. Katoozi
, E. H. Cannon
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
6
Adaptive accelerated aging for 28 nm HKMG technology
2017
·
Devyani Patra
, Ahmed Kamal Reza
, et al.
·
Microelectronics Reliability
·
4
A BIST design of structured arrays with fault-tolerant layout
2003
·
M. Katoozi
, M. Soma
·
IEEE International Test Conference (ITC)
·
4
Adaptive accelerated aging with 28nm HKMG technology
2017
·
Devyani Patra
, Ahmed Kamal Reza
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
2
Practical built-in test of CMOS state machines with realistic faults
2003
·
M. Katoozi
, M. Soma
·
IEEE International Symposium on Circuits and Systems proceedings
·
2
Built-in test of CMOS state machines with realistic faults: a system perspective
1990
·
M. Katoozi
, M. Soma
·
IEEE Journal of Solid-State Circuits
·
2
Low Overhead Built-in Testable Error Detection and Correction With Excellent Fault Coverage
2005
·
M. Katoozi
, A. Nordsieck
·
IEEE International Test Conference (ITC)
·
1
Built-in test of CMOS state machines with realistic faults: a system perspective
1989
·
M. Katoozi
, M. Soma
·
Custom Integrated Circuits Conference
·
1
Strategies and structures for test access in mixed-signal MCMs
2002
·
M. Katoozi
, H. Kutz
, et al.
·
IEEE Multi-Chip Module Conference
Show more works
View as search
Works count:
15
Citation count:
148
H-index:
6
I10-index:
2
Year
Topic
Type
