Author

Dirk Wolansky

Observed names: D Wolansky, D. Wolanski, D. Wolansky, Dirk Wolanski, Wolansky, D., Wolansky, Dirk 1965-
ORCID: 0000-0002-4058-4886
Observed ORCID: 0000-0002-4058-4886
OpenAlex ID: A5048578439
2011 · Christian Walczyk, Damian Walczyk, et al. · IEEE Transactions on Electron Devices · 251
2010 · B. Heinemann, R. Barth, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 180
2016 · B. Heinemann, H. Rucker, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 177
2010 · Holger Rucker, Bernd Heinemann, et al. · IEEE Journal of Solid-State Circuits · 156
2009 · H. Rucker, B. Heinemann, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 72
2014 · Gabriel Bertotti, Dmytro Velychko, et al. · IEEE Biomedical Circuits and Systems Conference (BioCAS) · 67
2013 · Udo Ch Kaletta, Paulo V Santos, et al. · Semiconductor Science and Technology · 50
2009 · M. Kaynak, K. E. Ehwald, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 50
2005 · B. Heinemann, R. Barth, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 50
2011 · Ch. Walczyk, Ch. Wenger, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 49
2008 · A. Fox, B. Heinemann, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 46
2011 · M. Birkholz, K.‐E. Ehwald, et al. · Advanced Functional Materials · 45
2009 · M. Birkholz, K.-E. Ehwald, et al. · Surface and Coatings Technology · 45
2003 · D. Knoll, K.E. Ehwald, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 44
2015 · Udo Christian Kaletta, Christian Wipf, et al. · IEEE Transactions on Electron Devices · 34
2010 · M. Kaynak, M. Wietstruck, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 32
2007 · H. Rucker, O. Fursenko, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 28
2010 · M. Lukosius, Ch. Walczyk, et al. · Thin Solid Films · 27
2012 · D. Walczyk, T. Bertaud, et al. · International Semiconductor Conference Dresden-Grenoble (ISCDG) · 26
2015 · Sven Schroder, Claudia Cecchetto, et al. · IEEE Biomedical Circuits and Systems Conference (BioCAS) · 23
2004 · D. Knoll, B. Heinemann, et al. · IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) · 23
2003 · V. Melnik, D. Wolanski, et al. · Materials Science and Engineering B · 17
Works count: 84
Citation count: 1,886
H-index: 23
I10-index: 31
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