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Guido Notermans

Observed names: G. Notermans, G.H.J. Notermans, Notermans, Guido
ORCID: 0000-0003-0861-3066
Observed ORCID: 0000-0003-0861-3066
OpenAlex ID: A5050467209
Pitfalls when correlating TLP, HBM and MM testing
2002 · G. Notermans, P. De Jong, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 71
Using an SCR as ESD protection without latch-up danger
1997 · Guido Notermans, Fred Kuper, et al. · Microelectronics Reliability · 45
The effect of silicide on ESD performance
2003 · G. Notermans, A. Heringa, et al. · IEEE International Reliability Physics Symposium proceedings · 42
On the use of n-well resistors for uniform triggering of ESD protection elements
1997 · G. Notermans · Electrical Overstress/Electrostatic Discharge Symposium · 35
ESD protection for high-voltage CMOS technologies
2006 · O. Quittard, Ž. Mrčarica, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 33
A Class-AB/D Audio Power Amplifier for Mobile Applications Integrated Into a 2.5G/3G Baseband Processor
2010 · Willem H Groeneweg, Bernard Pilloud, et al. · IEEE Transactions on Circuits and Systems I Regular Papers · 16
Designing HV active clamps for HBM robustness
2007 · Guido Notermans, Olivier Quittard, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 16
Dynamic Voltage Overshoot During Triggering of an SCR-Type ESD Protection
2019 · Guido Notermans, Hans-Martin Ritter, et al. · IEEE Transactions on Device and Materials Reliability · 15
Gun tests of a USB3 host controller board
2016 · Guido Notermans, Hans-Martin Ritter, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 14
Modeling dynamic overshoot in ESD protections
2018 · Guido Notermans, Hans-Martin Ritter, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 11
Air-discharge testing of single components
2015 · Hans-Martin Ritter, Lars Koch, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 10
Modelling transient voltage overshoot of a forward biased pn-junction diode with intrinsic doped region
2018 · Steffen Holland, Guido Notermans, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 9
Design of an On-Board ESD Protection for USB3 Applications
2016 · Guido Notermans, Hans-Martin Ritter, et al. · IEEE Transactions on Device and Materials Reliability · 8
Common mode filter for USB 3 interfaces
2016 · Jens Werner, Jennifer Schutt, et al. · IEEE International Symposium on Electromagnetic Compatibility · 8
Race Conditions Among Protection Devices for a High Speed I/O Interface
2020 · Jianchi Zhou, Javad Soleiman Meiguni, et al. · 7
On-chip system level protection of FM antenna pin with improved linearity
2011 · Guido Notermans, Dejan Maksimovic, et al. · Microelectronics Reliability · 7
Gate oxide protection and ggNMOSTs in 65 nm
2008 · Guido Notermans, Theo Smedes, et al. · 7
3-D TCAD Methodology for Simulating Double-Hysteresis Filamentary I–V Behavior and Holding Current in ESD Protection SCRs
2021 · Hasan Karaca, Steffen Holland, et al. · IEEE Transactions on Electron Devices · 6
An off-chip ESD protection for high-speed interfaces
2015 · Guido Notermans, Hans-Martin Ritter, et al. · Electrical Overstress/Electrostatic Discharge Symposium · 6
HMM–TLP correlation for system-efficient ESD design
2011 · Guido Notermans, Sergey Bychikhin, et al. · Microelectronics Reliability · 6
The energy straggling of protons in thin carbon foils
1983 · G.H.J. Notermans, R.G. Smeenk, et al. · Nuclear Instruments and Methods in Physics Research · 6
TIM, EMMI and 3D TCAD analysis of discrete-technology SCRs
2017 · C. Fleury, G. Notermans, et al. · Microelectronics Reliability · 5
ESD protection for thin gate oxides in 65nm
2009 · Guido Notermans, Theo Smedes, et al. · Microelectronics Reliability · 5
Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse
2021 · Jianchi Zhou, Pengyu Wei, et al. · IEEE Transactions on Electromagnetic Compatibility · 4
Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data
2022 · Steffen Holland, Simon Rauchel, et al. · Annual EOS/ESD Symposium (EOS/ESD) · 3
Works count: 48
Citation count: 426
H-index: 10
I10-index: 11
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