Author

Achim Nadzeyka

Observed names: A Nadzeyka, A. Nadzeyka, Nadzeyka, A., Nadzeyka, Achim
Institution: Raith (Germany)
ORCID: 0009-0003-9078-3466
Observed ORCID: 0009-0003-9078-3466
OpenAlex ID: A5059103233
2016 · D. Emmrich, A. Beyer, et al. · Applied Physics Letters · 121
2020 · F. Godejohann, A. V. Scherbakov, et al. · Physical review. B./Physical review. B · 85
2013 · Deanpen Japrung, Jakob Dogan, et al. · Analytical Chemistry · 84
2023 · Dmytro D. Yaremkevich, Alexey V. Scherbakov, et al. · Nature Communications · 46
2002 · A. G. Drentje, U. Wolters, et al. · Review of Scientific Instruments · 45
2014 · Lei Mo, Liu Yang, et al. · Optics Express · 35
2014 · Deanpen Japrung, Azadeh Bahrami, et al. · The Journal of Physical Chemistry B · 32
2012 · A. Nadzeyka, L. Peto, et al. · Microelectronic Engineering · 22
2023 · Akhil Varri, Shabnam Taheriniya, et al. · Advanced Materials · 21
2013 · Sven Bauerdick, Lars Bruchhaus, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 20
2012 · Sarvesh K Tripathi, Declan Scanlan, et al. · Journal of Micromechanics and Microengineering · 18
2001 · Y Kawai, D Meyer, et al. · Plasma Sources Science and Technology · 17
2021 · Dmytro D. Yaremkevich, Alexey V. Scherbakov, et al. · ACS Nano · 13
2016 · Gediminas Seniutinas, Armandas Balčytis, et al. · Applied Physics A · 12
2023 · Achim Nadzeyka, Torsten Richter, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 10
2022 · Wenjing Yan, Andrey V. Akimov, et al. · Nano Letters · 10
1996 · D. Meyer, A. Nadzeyka, et al. · Review of Scientific Instruments · 8
2023 · A.V. Scherbakov, T.L. Linnik, et al. · Photoacoustics · 6
2024 · M. Hollenbach, N. Klingner, et al. · Advanced Quantum Technologies · 5
2024 · Alexey V. Scherbakov, Alex D. Carr, et al. · Physical Review Research · 4
2013 · A. M. Mio, G. D'Arrigo, et al. · Journal of Applied Physics · 4
2024 · B. Salmond, D. D. John, et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2
2014 · R.G. Milazzo, G. D’Arrigo, et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2
2013 · J. Klingfus, A. Nadzeyka, et al. · Microscopy and Microanalysis · 2
Works count: 45
Citation count: 632
H-index: 13
I10-index: 16
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