Author

Michael H. Herman

Observed names: M. H. Herman, M.H. Herman

Observed institutions: Intel (United States), Sunnyvale Public Library

OpenAlex ID: A5062844570

Band offset determination in analog graded parabolic and triangular quantum wells of GaAs/AlGaAs and GaInAs/AlInAs

1992 · R. F. Kopf, M. H. Herman, et al. · Journal of Applied Physics · 127

Band offset determination in parabolic and triangular quantum wells of GaAs/AlGaAs and GaInAs/AlInAs

1993 · R. F. Kopf, M. H. Herman, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 25

Photoluminescence and electroreflectance studies of modulation-doped pseudomorphic AlGaAs/InGaAs/GaAs quantum wells

1990 · Ananth Dodabalapur, V. P. Kesan, et al. · Journal of Electronic Materials · 18

Realizing the potential of photoconductive switching for HPM applications

1995 · Jeffrey A. Oicles, Jon R. Grant, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 10

Discussion of modulation mechanisms in electron-beam electroreflectance and comparison to alternative modulation techniques

1990 · Michael H. Herman · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 8

Applications of Rutherford backscattering spectrometry to refractory metal silicide characterization

1984 · Michael H. Herman · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 8

Lifetime of BASS devices on 50-ohm video pulser circuits

1993 · Michael H. Herman, S. M. Ahern, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 4

e-Beam electroreflectance of short-period SiGe superlattices

1990 · M.A. Gell, M.H. Herman, et al. · Vacuum · 4

Characterization of III-V Semiconductor Structures Using Electron Beam Electroreflectance (EBER) spectroscopy.

1988 · M. H. Herman, I. D. Ward, et al. · MRS Proceedings · 4

Investigations of Residual Chlorine on Etched AlCu Metal Lines by Total Reflection X-Ray Fluorescence (TXRF)

1991 · R. S. Hockett, M. H. Herman, et al. · MRS Proceedings · 3

Evidence for new optical transitions in short-period Si/Ge superlattices from electron-beam electroreflectance measurements

1990 · Michael A. Gell, Michael H. Herman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 3

Characterization of Modulation Doped Pseudomorphic AlGaAs/InGaAs/GaAs Hemt Structures by Electron Beam Electroreflectance and Photoluminescence

1989 · M. H. Herman, I. D. Ward, et al. · MRS Proceedings · 2

Characterization of Undoped Pseudomorphic InGaAs/GaAs Quantum Wells by Electron Beam Electroreflectance (EBER) and Photoluminescence (PL)

1989 · M. H. Herman, A. Dodabalafur, et al. · MRS Proceedings · 2

Rapid MOSFET threshold voltage testing for high throughput semiconductor process monitoring

2024 · Michael H. Herman, Trenton T. Nguyen, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 1

Issues and advances in rapid Quasi-Static CV for high throughput semiconductor process monitoring

2022 · Michael H. Herman, Daniel Jang, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 1

Bulk avalanche semiconductor switches (BASS) for high-resolution ultrawideband radar (UWBR) applications

1993 · Heikki I. Helava, Michael H. Herman, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Performance and Reliability of BASS Devices

1993 · M.H. Herman, D. Mansfield, et al. · IEEE International Pulsed Power Conference (PPC) · 1

Nondestructive evaluation of junction effects in GaAs avalanche photoconductors

1992 · Michael H. Herman, Kenneth M. Positeri, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

Effects of Helium Ion Implantation on the Optical and Crystal Properties of GaAs

1989 · R. C. Bowman, P. M. Adams, et al. · MRS Proceedings · 1

Effects of Rapid Thermal Anneals on Boron Implanted GaAs

1988 · R. C. Bowman, P. M. Adams, et al. · MRS Proceedings · 1

Chemography of silicon surfaces

1985 · Eugene S. Meieran, Ilan A. Blech, et al. · Journal of Applied Physics · 1

Evaluation of Rapid Vt Testing of Wafer-Level MOSFETs

2025 · Michael H. Herman, Ben Morris · IEEE International Conference on Microelectronic Test Structures (ICMTS)

Role Of Ion-implantation Induced Damage And Surface States In The Response Of Gallium Arsenide Picosecond Photoconductive Switches

2005 · D.D. Smith, J.F. Knudsen, et al. · IEEE Lasers and Electro-Optics Society Annual Meeting (LEOS)

Synthesis of Critical Point Energies for 1 MeV Electron Irradiated P-Type Silicon

1992 · Onofrio L. Russo, Katherine A. Dumas, et al. · MRS Proceedings

Development and evaluation of an instrument for rapid electroreflectance of semiconductor materials