Author

Toyoshi Yamaoka

Observed names: T. YAMAOKA, T. Yamaoka, Toyoshi YAMAOKA

Institution: Fujitsu (Japan)

Observed institution: Fujitsu (Japan)

OpenAlex ID: A5065002937

Characteristics of germanium avalanche photodiodes in the wavelength region of 1-1.6 µm

1978 · H. Ando, H. Kanbe, et al. · IEEE Journal of Quantum Electronics · 107

Degradation of high-radiance Ga1−xAlxAs LED’s

1977 · Shigenobu Yamakoshi, Osamu Hasegawa, et al. · Applied Physics Letters · 81

Vapor Phase Epitaxial Growth of MgO · Al2 O 3

1982 · Masaru Ihara, Yoshihiro Arimoto, et al. · Journal of The Electrochemical Society · 76

Ionization rates for electrons and holes in GaAs

1978 · Masanori Ito, Shuzo Kagawa, et al. · Journal of Applied Physics · 62

Determination of In-Ga-As phase diagram at 650 °C and LPE growth of lattice-matched In0.53Ga0.47As on InP

1979 · Kazuo Nakajima, Toshiyuki Tanahashi, et al. · Journal of Applied Physics · 60

Self-aligned contact process for Nb/Al-AlOx/Nb Josephson junctions

1986 · Shin’ichi Morohashi, Shinya Hasuo, et al. · Applied Physics Letters · 50

LPE Growth of Misfit Dislocation‐Free Thick In1 − x Ga x As Layers on InP

1980 · Kazuo Nakajima, Satoshi Komiya, et al. · Journal of The Electrochemical Society · 44

PDF

High-efficiency long-lived GaAlAs LED's for fiber-optical communications

1977 · M. Abe, I. Umebu, et al. · IEEE Transactions on Electron Devices · 38

A model for reach-through avalanche photodiodes (RAPD’s)

1976 · Takao Kaneda, Hideo Matsumoto, et al. · Journal of Applied Physics · 37

Impact ionisation ratio in In 0.73 Ga 0.27 As 0.57 P 0.43

1978 · Masanori Ito, Takao Kaneda, et al. · Electronics Letters · 36

Transmission electron microscope observation of dark-spot defects in InGaAsP/InP double-heterostructure light-emitting diodes aged at high temperature

1980 · Osamu Ueda, Shigenobu Yamakoshi, et al. · Applied Physics Letters · 33

Avalanche buildup time of silicon reach-through photodiodes

1976 · Takao Kaneda, Hirobumi Takanashi, et al. · Journal of Applied Physics · 28

Defect structure of 〈100〉 dark lines in the active region of a rapidly degraded Ga1−xAlxAs LED

1977 · Osamu Ueda, Shoji Isozumi, et al. · Journal of Applied Physics · 27

9 ps Gate Delay Josephson OR Gate with Modified Variable Threshold Logic

1985 · Norio Fujimaki, Seigo Kotani, et al. · Japanese Journal of Applied Physics · 23

PDF

Excess noise in silicon avalanche photodiodes

1976 · T. Kaneda, H. Matsumoto, et al. · Journal of Applied Physics · 22

Formation of low defect density SiOx films for Josephson integrated circuits

1985 · H. Shibayama, S. Hasuo, et al. · Applied Physics Letters · 21

Current Injection Effects in a Nb/AlOx-Al/Nb/n-InSb Triode

1985 · Hirotaka Tamura, Shinya Hasuo, et al. · Japanese Journal of Applied Physics · 20

PDF

Abrupt degradation of three types of semiconductor light emitting diodes at high temperature

1980 · Osamu Ueda, Hajime Imai, et al. · Journal of Applied Physics · 17

Silicon avalanche photodiodes

1976 · Toyoshi Yamaoka, Hideo Matsumoto, et al. · Fujitsu Scientific and Technical Journal · 16

Transmission Electron Microscope Observation of Mechanically Damaged InGaAsP/InP Double-Heterostructure Light-Emitting Diode

1980 · Osamu Ueda, Shigenobu Yamakoshi, et al. · Japanese Journal of Applied Physics · 13

PDF

Fabrication technology for lead-alloy Josephson devices for high-density integrated circuits

1986 · T. Imamura, H. Hoko, et al. · Journal of Applied Physics · 10

Efficient coupling of LED and spherical-ended fiber

1978 · Osamu Hasegawa, Masayuki Abe, et al. · Journal of Applied Physics · 10

Spinel-Isolated high-voltage ICs

1981 · M. Ihara, Y. Arimoto, et al. · Digest of technical papers/Digest of technical papers - IEEE International Solid-State Circuits Conference · 8

5.6 ps Gate Delay All Refractory Josephson OR Gate with Modified Variable Threshold Logic

1985 · Seigo Kotani, Norio Fujimaki, et al. · Japanese Journal of Applied Physics · 6

Characteristics of a counter-electrode coupled logic gate using Josephson junctions

1981 · S. Hasuo, H. Suzuki, et al. · IEEE Transactions on Magnetics · 6

Works count: 48

Citation count: 894

H-index: 17

I10-index: 22