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Klaus Miethe

Observed names: K Miethe, K. Miethe
OpenAlex ID: A5068327214
Charge transfer of hydrogen atoms in N2and in caesium vapour
1982 · K Miethe, T Dreiseidler, et al. · Journal of Physics B Atomic and Molecular Physics · 14
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Surface- and sidewall-damage of InP-based optoelectronic devices during reactive ion etching using CH/sub 4//H/sub 2/
2002 · T. Bottner, H. Krautle, et al. · Conference proceedings. ... International Conference on Indium Phosphide and Related Materials · 9
Synergetic effects during sputter-assisted depth profiling: Growth-dominated topography development on InP and a model of the atomic mechanism
1987 · Werner H. Gries, Klaus Miethe · Microchimica Acta · 7
Use of maximum entropy deconvolution for the study of silicon delta layers in GaAs
1996 · G. A. Cooke, M. G. Dowsett, et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 6
Electron diffusion length in InGaAs:Zn derived from heterostructure bipolar transistors
1995 · E. Kuphal, K. Mause, et al. · Solid-State Electronics · 6
Application of infrared luminescence microscopy for ion beam diagnostics and for measurement of ion dose densities from 109 to 1016 cm?2
1991 · O. Hoinkis, K. Miethe, et al. · Analytical and Bioanalytical Chemistry · 4
Summary Abstract: Effects of a cesium ion beam on GaAs, InP, and Si
1987 · W. H. Gries, K. Miethe · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 4
Small angle scattering of 350 keV protons in silicon at grazing incidence
1979 · Klaus Miethe, Ulrich Schiebel, et al. · Nuclear Instruments and Methods · 4
Sn-doped InGaAs layers grown by low-pressure metalorganic vapour phase epitaxy
1994 · A. Eisenbach, E. Kuphal, et al. · Journal of Crystal Growth · 3
Sudden surface roughening followed by levelling observed in SIMS analysis of InP‐containing III–V multilayers
1993 · K. Miethe, E. Kuphal · Surface and Interface Analysis · 3
Ion fractions of matrix elements and impurities in GaAs bombarded by O 2 + primary ions
1989 · K. Miethe · Fresenius Zeitschrift für Analytische Chemie · 3
Ion Deposition Effects in and Around Sputter Craters Formed by Cesium Primary Ions
1986 · K. Miethe, W. H. Gries, et al. · Springer series in chemical physics · 3
SIMS-Analyse von optischen Fasern
1987 · K. Miethe · Fresenius Zeitschrift für Analytische Chemie · 2
Effects of a caesium Ion beam on GaAs
1986 · K. Miethe, W. H. Gries, et al. · Surface and Interface Analysis · 1
Improvement of an Ion Microprobe Mass Analyzer (IMMA)
1986 · K. Miethe, A. Pöcker · Springer series in chemical physics · 1
Works count: 15
Citation count: 70
H-index: 5
I10-index: 1
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