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Gyu-Han Yoon
Observed names:
GYUHAN YOON,
Gyu Han Yoon,
Gyuhan Yoon
Institution:
Sogang University
Observed institutions:
Sogang University,
LG (South Korea),
SK Hynix (South Korea)
OpenAlex ID:
A5073996812
A shallow trench isolation using nitric oxide (NO)-annealed wall oxide to suppress inverse narrow width effect
2000
·
Jongoh Kim
, Taewoo Kim
, et al.
·
IEEE Electron Device Letters
·
24
Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors
2019
·
Seongun Shin
, Gyuhan Yoon
, et al.
·
JSTS Journal of Semiconductor Technology and Science
·
7
CMOSFET characteristics induced by moisture diffusion from inter-layer dielectric in 0.23 um DRAM technology with shallow trench isolation
2002
·
Sung-Kye Park
, Moon-Sik Suh
, et al.
·
IEEE International Reliability Physics Symposium proceedings
·
7
Modeling of Statistical Variation Effects on DRAM Sense Amplifier Offset Voltage
2021
·
Kyung Min Koo
, Woo Young Chung
, et al.
·
Micromachines
·
6
PDF
A Technology-Computer-Aided-Design-Based Reliability Prediction Model for DRAM Storage Capacitors
2019
·
Woo Young Choi
, Gyuhan Yoon
, et al.
·
Micromachines
·
6
PDF
Charge trap length dependence and transconductance characteristics of a 2T SONOS cell
2014
·
Tae-Ho Lee
, Young-Jun Kwon
, et al.
·
Non-Volatile Memory Technology Symposium
·
4
Aberration sensitivity control for the isolation layer in low-k1 DRAM process
2002
·
Byeong-Ho Cho
, Donggyu Yim
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
·
4
On-current Modeling of 70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions
2018
·
Woo Young Choi
, In Eui Lim
, et al.
·
JSTS Journal of Semiconductor Technology and Science
·
3
2T-SONOS Cell Using Novel Process Integration on HV-CMOS Platform for Versatile Application
2019
·
Sung-Kun Park
, Young-Jun Kwon
, et al.
·
IEEE International Memory Workshop (IMW)
·
2
Floating-base Bjt Type Esd Device for Rfid Chip
2009
·
JINYONG CHUNG
, HEE-BOK KANG
, et al.
·
Integrated ferroelectrics
·
1
WID Rnit Variation Improvements for HSS STI CMP Process using Modified Scribe Lane Pattern Design
2004
·
Hyuk Kwon
, Yong-Soo Choi
, et al.
·
MRS Proceedings
·
1
Drain-current Modeling of Sub-70-nm PMOSFETs Dependent on Hot-carrier Stress Bias Conditions
2017
·
In Eui Lim
, Heesauk Jhon
, et al.
·
JSTS Journal of Semiconductor Technology and Science
Influence of Electron and Hole Distribution on 2T SONOS Embedded NVM
2016
·
Woo Young Choi
, Da Som Kim
, et al.
·
JSTS Journal of Semiconductor Technology and Science
On-State Resistance Instability of Programmed Antifuse Cells during Read Operation
2014
·
Jae Hwan Han
, Hyunjin Lee
, et al.
·
JSTS Journal of Semiconductor Technology and Science
A new extraction method of retention time from the leakage current in 0.23 μm DRAM memory cell
2002
·
Choong-Mo Nam
, Sung-Kye Park
, et al.
·
IEEE International Conference on Microelectronic Test Structures (ICMTS)
Manufacturable 0.13 μm DRAM Technology for 512M DDR DRAM
2001
·
Yong-Hae Kim
, Dae-Young Kim
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
Optimum field-size strategy for DRAM mass production in low-k1 process
2001
·
Chan-Ha Park
, Donggyu Yim
, et al.
·
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
Study of Optimization Guidelines on Nitrogen Concentration in Nitrided Oxide for Logic and Dynamic Random Access Memory Application
2000
·
Jong-Wan Jung
, Sung-Kye Park
, et al.
·
Japanese Journal of Applied Physics
PDF
New Optimazation Guidelines on Nitrogen Concentration in NO Gate Dielectrics for Advanced Logic and DRAM Application
1999
·
Jon-Wan Jung
, Sung-Kye Park
, et al.
·
International Conference on Solid State Devices and Materials (SSDM)
Moisture Induced Hump Characteristics of Shallow Trench-Isolated Sub-1/4μm nMOSFET
1999
·
Sung-Kye Park
, Young‐Chul Lee
, et al.
·
SIAM International Conference on Data Mining
Hot Electron Degradation via Hot Hole Injection in Submicron Buried-Channel LDD P-MOSFET`s
1995
·
Hyung J. Lee
, Gyu Han Yoon
, et al.
·
International Conference on VLSI and CAD
Three transistor cell for high speed CMOS EPROM technology
1986
·
Sang-Soo Lee
, Jong-Sup Yoon
, et al.
·
Technical digest - International Electron Devices Meeting/Technical digest
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Works count:
22
Citation count:
65
H-index:
5
I10-index:
1
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