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Etienne Auvray

Observed names: Auvray, Etienne, E. Auvray
OpenAlex ID: A5074769604
Effect-cause intra-cell diagnosis at transistor level
2013 · Zhenzhou Sun, A. Bosio, et al. · International Symposium on Quality Electronic Design (ISQED) · 13
Automatic Fault Simulators for Diagnosis of Analog Systems
2020 · Tommaso Melis, Emmanuel Simeu, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 11
Effective scan chain failure analysis method
2017 · Etienne Auvray, Paul Armagnat, et al. · Microelectronics Reliability · 11
Scan-Chain Intra-Cell Aware Testing
2016 · Aymen Touati, Alberto Bosio, et al. · IEEE Transactions on Emerging Topics in Computing · 10
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Analog and Mixed Signal Diagnosis Flow Using Fault Isolation Techniques and Simulation
2020 · Tommaso Melis, Emmanuel Simeu, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 8
Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip
2019 · S. Mhamdi, A. Virazel, et al. · IEEE International On-Line Testing Symposium (IOLTS) · 7
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Use of Analog Simulation in Failure Analysis: Application to Emission Microscopy and Laser Voltage Probing Techniques
2018 · Etienne Auvray, Luc Saury, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 7
FASTKIT—A Software Tool for Easy Design Visibility and Diagnostic Enhancement for Failure Analysis
2015 · Etienne Auvray, Paul Armagnat · Proceedings - International Symposium for Testing and Failure Analysis · 7
Intra-Cell Defects Diagnosis
2014 · Z. Sun, A. Bosio, et al. · Journal of Electronic Testing · 7
Light Emission Tracking and Measurements for Analog Circuits Fault Diagnosis in Automotive Applications
2023 · Tommaso Melis, Emmanuel Simeu, et al. · Journal of Electronic Testing · 6
Analog and mixed-signal circuits simulation for product level EMMI analysis
2020 · Tommaso Melis, Emmanuel Simeu, et al. · Microelectronics Reliability · 5
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On the Generation of Diagnostic Test Set for Intra-cell Defects
2014 · Z. Sun, A. Bosio, et al. · Proceedings - Asian Test Symposium/Proceedings · 5
Improved Fault Diagnosis of Analog Circuits using Light Emission Measures
2021 · Tommaso Melis, Emmanuel Simeu, et al. · IEEE Latin American Test Symposium (LATS) · 4
Fault Localization Improvement through an Intra-Cell Diagnosis Approach
2012 · Zhenzhou Sun, Alberto Bosio, et al. · Proceedings - International Symposium for Testing and Failure Analysis · 4
Software-enabled design visibility enhancement for failure analysis process improvement
2009 · Chia-Chih Yen, Shen-Tien Lin, et al. · International Symposium on VLSI Design, Automation and Test · 3
Die repackaging for failure analysis
2005 · S. Barberan, E. Auvray · Microelectronics Reliability · 3
Simulation based dynamic laser stimulation for failure analysis of analog and mixed-signal circuits
2021 · T. Melis, E. Simeu, et al. · Microelectronics Reliability · 2
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Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal Circuits
2021 · Tommaso Melis, Emmanuel Simeu, et al. · IEEE International Test Conference (ITC) · 1
Analog and mixed-signal circuits simulation for product level EMMI analysis
2020 · Melis, Tommaso, Simeu, Emmanuel, et al. · HAL
Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis
2013 · Sun, Zhenzhou, Bosio, Alberto, et al. · HAL
Works count: 20
Citation count: 114
H-index: 7
I10-index: 4
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