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Author

S. Eichenberger

Observed name: Stefan Eichenberger
Institution: NXP (Netherlands)
OpenAlex ID: A5074964895
On hazard-free patterns for fine-delay fault testing
2005 · B. Kruseman, A.K. Majhi, et al. · IEEE International Test Conference (ITC) · 108
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs
2009 · F. Hapke, R. Krenz-Baath, et al. · IEEE International Test Conference (ITC) · 95
Power Supply Noise in Delay Testing
2006 · Jing Wang, D. M. H. Walker, et al. · IEEE International Test Conference (ITC) · 80
Systematic defects in deep sub-micron technologies
2005 · B. Kruseman, A. Majhi, et al. · IEEE International Test Conference (ITC) · 69
Delay defect screening using process monitor structures
2004 · S. Mitra, E. Volkerink, et al. · IEEE VLSI Test Symposium (VTS) · 68
An effective diagnosis method to support yield improvement
2003 · C. Hora, R. Segers, et al. · IEEE International Test Conference (ITC) · 65
Defect-oriented cell-internal testing
2010 · F. Hapke, W. Redemund, et al. · IEEE International Test Conference (ITC) · 54
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality
2008 · S. Eichenberger, J. Geuzebroek, et al. · IEEE International Test Conference (ITC) · 43
Modeling Power Supply Noise in Delay Testing
2007 · Jing Wang, D.M. Walker, et al. · IEEE Design & Test of Computers · 28
Gate-Exhaustive and Cell-Aware pattern sets for industrial designs
2011 · Friedrich Hapke, Juergen Schloeffel, et al. · International Symposium on VLSI Design, Automation and Test · 21
Full Open Defects in Nanometric CMOS
2008 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 15
Memory Testing Under Different Stress Conditions: An Industrial Evaluation
2005 · A.K. Majhi, M. Azimane, et al. · Design, Automation, and Test in Europe · 14
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Impact of gate tunnelling leakage on CMOS circuits with full open defects
2007 · R. Rodríguez-Montañés, D. Arumí, et al. · Electronics Letters · 12
Localization and Electrical Characterization of Interconnect Open Defects
2010 · Rosa Rodriguez-Montanes, Daniel Arumi, et al. · IEEE Transactions on Semiconductor Manufacturing · 11
On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up
2003 · Camelia Hora, Rene Segers, et al. · Journal of Electronic Testing · 10
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages
2007 · D. Arumi, R. Rodriguez-Montanes, et al. · IEEE VLSI Test Symposium (VTS) · 9
I DDQ -based diagnosis at very low voltage (VLV) for bridging defects
2007 · D. Arumi, R. Rodríguez-Montañés, et al. · Electronics Letters · 9
Gate Leakage Impact on Full Open Defects in Interconnect Lines
2010 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 8
Time-dependent Behaviour of Full Open Defects in Interconnect Lines
2008 · R. Rodriguez-Montanes, D. Arumi, et al. · IEEE International Test Conference (ITC) · 6
Improving diagnostic resolution of delay faults using path delay fault model
2003 · A.K. Majhi, G. Gronthoud, et al. · IEEE VLSI Test Symposium (VTS) · 6
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out
2011 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 5
Impact of Temperature on Test Quality
2010 · Lavanya Jagan, Camelia Hora, et al. · International Conference on VLSI Design · 5
Towards High Accuracy Fault Diagnosis of Digital Circuits
2004 · Camelia Hora, Stefan Eichenberger · Proceedings - International Symposium for Testing and Failure Analysis · 4
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents
2013 · Daniel Arumi, Rosa Rodriguez-Montanes, et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2
Memory testing improvements through different stress conditions
2005 · A. Majhi, M. Azimane, et al. · European Solid-State Circuits Conference (ESSCIRC) · 1
Works count: 28
Citation count: 748
H-index: 12
I10-index: 15
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