Author

Ralf Schuster

Observed name: R. Schuster

ORCID: 0000-0003-3998-2219

Observed ORCID: 0000-0003-3998-2219

OpenAlex ID: A5075515860

2000 · A.K. Wong, R. Ferguson, et al. · IEEE Transactions on Semiconductor Manufacturing · 107

2002 · Kay Lederer, Steffen R. Hornig, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2

2003 · Tobias Mono, Uwe P. Schroeder, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1

2003 · R. Schuster · International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) · 1

2003 · D. Ganz, A. Charles, et al. · IEEE International Symposium on Semiconductor Manufacturing conference proceedings · 1

2002 · D. Ganz, A. Charles, et al. · IEEE International Symposium on Semiconductor Manufacturing conference proceedings

2000 · Karl E. Mautz, Thomas Morgenstern, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2000 · Alain B. Charles, Clint Haris, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2000 · Sebastian Schmidt, Alain B. Charles, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

2000 · Thorsten Schedel, Alain B. Charles, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

Works count: 10

Citation count: 112

H-index: 2

I10-index: 1