Author

Renu Whig

Observed names: R Whig, R. Whig, Whig, Renu
OpenAlex ID: A5083551050
2000 · S. Tehrani, B. Engel, et al. · IEEE Transactions on Magnetics · 331
2013 · N. D. Rizzo, D. Houssameddine, et al. · IEEE Transactions on Magnetics · 150
2000 · E. Y. Chen, R. Whig, et al. · Journal of Applied Physics · 53
2017 · D. Shum, D. Houssameddine, et al. · Symposium on VLSI Technology · 52
2012 · J. M. Slaughter, N. D. Rizzo, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 45
2016 · J. M. Slaughter, K. Nagel, et al. · Technical digest - International Electron Devices Meeting/Technical digest · 39
2014 · Yadong Xu, Bowen Yang, et al. · Applied Physics Letters · 23
2018 · Lin Xue, Chi Ching, et al. · Symposium on VLSI Technology · 20
2013 · J. Janesky, N.D. Rizzo, et al. · IEEE International Memory Workshop (IMW) · 13
2000 · P. J. S. Mangat, W. J. Dauksher, et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 8
2017 · J.M. Slaughter, K. Nagel, et al. · IEEE International Magnetics Conference · 7
2019 · R. Whig, C. Ching, et al. · IEEE International Memory Workshop (IMW) · 6
2012 · Simon Hemour, Dimitri Houssameddine, et al. · IEEE MTT-S International Microwave Symposium digest · 6
2010 · J. M. Slaughter, Nicholas D. Rizzo, et al. · まぐね = Magnetics Japan · 4
2000 · S. Tehrani, M. Durlam, et al. · 日本応用磁気学会研究会資料 · 2
1998 · Cameron J. Brooks, Douglas E. Benoit, et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2
2025 · Bruno Coppolelli, Davide Cornigli, et al. · IEEE International Reliability Physics Symposium proceedings
2016 · J M Slaughter, K Nagel, et al. · IEEE Conference Proceedings
2015 · Yadong Xu, Bowen Yang, et al. · Bulletin of the American Physical Society
2010 · J. M. Slaughter, Nicholas D. Rizzo, et al. · 한국자기학회 학술연구발표회 논문개요집
Works count: 21
Citation count: 761
H-index: 9
I10-index: 9
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