Author

M.P.J. Tiggelman

Observed names: M Tiggelman, M. P. J. Tiggelman, M. Tiggelman, Mark P.J. Tiggelman, Mark Tiggelman

OpenAlex ID: A5086334855

2009 · M. P. J. Tiggelman, K. Reimann, et al. · IEEE Transactions on Electron Devices · 49

2008 · M. P. J. Tiggelman, K. Reimann, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 22

2009 · Mareike Klee, Marco Van Esch, et al. · IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control · 16

2010 · M Klee, H Boots, et al. · IOP Conference Series Materials Science and Engineering · 15

2007 · M.P.J. Tiggelman, K. Reimann, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 11

2012 · R. W. Herfst, P. G. Steeneken, et al. · IEEE Transactions on Semiconductor Manufacturing · 8

2006 · M. Klee, D. Beelen, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF) · 7

2009 · M.P.J. Tiggelman, K. Reimann, et al. · Thin Solid Films · 5

2010 · R. W. Herfst, P. G. Steeneken, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 4

2009 · Mark Tiggelman · 4

2008 · M. Klee, W. Keur, et al. · IEEE International Symposium on Applications of Ferroelectrics (ISAF) · 3

2006 · M.P.J. Tiggelman, K. Reimann, et al. · University of Twente Research Information · 2

2006 · R.G. Bankras, M.P.J. Tiggelman, et al. · IEEE International Conference on Microelectronic Test Structures (ICMTS) · 2

2008 · M.P.J. Tiggelman, K. Reimann, et al. · University of Twente Research Information · 1

2007 · M.P.J. Tiggelman, K. Reimann, et al. · University of Twente Research Information · 1

2005 · M.P.J. Tiggelman · University of Twente Research Information · 1

Works count: 16

Citation count: 151

H-index: 7

I10-index: 5