Product
Help
Pricing
About
Jobs
Log in
Get started
Author
Add to collection
Hung‐Che Ting
Observed name:
Hung-Che Ting
Institution:
AU Optronics (Taiwan)
Observed institutions:
AU Optronics (Taiwan),
National Sun Yat-sen University,
Industrial Technology Research Institute,
National Cheng Kung University
OpenAlex ID:
A5086726738
Development of IGZO TFTs and their applications to next‐generation flat‐panel displays
2010
·
Hsing‐Hung Hsieh
, Hsiung‐Hsing Lu
, et al.
·
Journal of Information Display
·
102
PDF
Self-Heating-Effect-Induced Degradation Behaviors in a-InGaZnO Thin-Film Transistors
2012
·
Tien-Yu Hsieh
, Ting-Chang Chang
, et al.
·
IEEE Electron Device Letters
·
54
76.3: 32‐inch LCD Panel Using Amorphous Indium‐Gallium‐Zinc‐Oxide TFTs
2010
·
Hsiung‐Hsing Lu
, Hung‐Che Ting
, et al.
·
SID Symposium Digest of Technical Papers
·
48
Investigating the Drain-Bias-Induced Degradation Behavior Under Light Illumination for InGaZnO Thin-Film Transistors
2012
·
Tien-Yu Hsieh
, Ting-Chang Chang
, et al.
·
IEEE Electron Device Letters
·
45
Self-heating enhanced charge trapping effect for InGaZnO thin film transistor
2012
·
Te-Chih Chen
, Ting-Chang Chang
, et al.
·
Applied Physics Letters
·
43
30.1: Invited Paper : 65‐Inch Inkjet Printed Organic Light‐Emitting Display Panel with High Degree of Pixel Uniformity
2014
·
Peng‐Yu Chen
, Chih‐Lei Chen
, et al.
·
SID Symposium Digest of Technical Papers
·
40
Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors
2012
·
Tien-Yu Hsieh
, Ting-Chang Chang
, et al.
·
Applied Physics Letters
·
32
Systematic Investigations on Self-Heating-Effect-Induced Degradation Behavior in a-InGaZnO Thin-Film Transistors
2012
·
Tien-Yu Hsieh
, Ting-Chang Chang
, et al.
·
IEEE Transactions on Electron Devices
·
30
53.1: Development of Oxide‐TFT OLED‐TV Technologies
2014
·
Tsung‐Hsiang Shih
, Hung‐Che Ting
, et al.
·
SID Symposium Digest of Technical Papers
·
16
21.3: A 65‐inch Amorphous Oxide Thin Film Transistors Active‐Matrix Organic Light‐Emitting Diode Television Using Side by Side and Fine Metal Mask Technology
2013
·
Chia‐Yu Chen
, Li‐Fong Lin
, et al.
·
SID Symposium Digest of Technical Papers
·
13
Investigating Degradation Behaviors Induced by DC and AC Bias-Stress under Light Illumination in InGaZnO Thin-Film Transistors
2012
·
Tien-Yu Hsieh
, Ting-Chang Chang
, et al.
·
ECS Journal of Solid State Science and Technology
·
13
PDF
High mobility metal oxide thin film transistors active-matrix organic light-emitting diode television
2014
·
Tsung-Hsiang Shih
, Hung-Che Ting
, et al.
·
International Workshop on Active-Matrix Flatpanel Displays and Devices
·
10
55.2: Ink‐Jet Printed AMOLED Displays Based on High Mobility IGZO TFTs: Cost Does Matter!
2013
·
Chih‐Lei Chen
, Yi‐Chen Chung
, et al.
·
SID Symposium Digest of Technical Papers
·
10
The effect of nitrous oxide plasma treatment on the bias temperature stress of metal oxide thin film transistors with high mobility
2014
·
Wei-Hao Tseng
, Shao-Wei Fang
, et al.
·
Solid-State Electronics
·
8
酸化物半導体 アモルファスigzo Tftを用いた32型液晶パネル (2020年の表示技術を展望) -- (ディスプレイ技術トレンド)
2011
·
Hsiung‐Hsing Lu
, Hung‐Che Ting
, et al.
·
ディスプレイ技術年鑑
33.4: An Improvement Process for Gate Oxide of LTPS TFT by Using N 2 O Plasma Nitridation
2004
·
Lin‐En Chou
, Hung‐Che Ting
·
SID Symposium Digest of Technical Papers
Show more works
View as search
Works count:
16
Citation count:
464
H-index:
11
I10-index:
13
Year
Topic
Type